TY  - BOOK
AU  - .
AU  - Siegel, Benjanin M.
TI  - Modern development in electron microscopy: edited by Benjamin M , Siegel
U1  - 578.15 SIM 
PY  - 1967///
CY  - New York
PB  - Academic press
KW  - Electronics
N1  - Includes bibliog & illus
ER  -